Latest Technologies for SSD, Flash and RAID data recovery

Beijing | October 10, 2016

About the conference:

  • Want to meet the newest challenges of the market?
  • Still using old methods to recover data from new storage devices?
  • ACE presents the latest features for recovering data from SSD, Flash-based devices and RAID.

Conference details:

Date: October 10, 2016

Time: 10.00 am – 17.00 pm

Place: Beijing Xihua Business Hotel
12 Yiheyuan Road (Yiheyuan Lu), Haidian District, Beijing, China

Conference program:
09:30 — 10:00 Registration
10:00 — 12:00 Technological Mode for SSD data recovery and repairing of damaged Solid State Drives:

Internal structure of a Solid State Drive

  • Variety of present-day SSD interfaces
  • New ACE Lab adapters for SSD
  • SSD main structural scheme
  • Working principles of controllers and NAND memory

Process of SSD initialization

  • Drive initialization steps and their role
  • Internal ROM, Loader and Microprogram
  • Solid State Drive modes: Normal mode, Safe mode

The most widespread issues in SSD

  • Physical and Logical issues
  • New types of NAND Flash chips architecture. Improvements and disadvantages
  • Bit errors as a main reason of SSD corruption

Modern SSD and Chip-Off technology

  • Stages of data recovery in the "classic method"
  • XOR and hardware encryption
  • Swapping of SSD components. Importance of CPU-ROM-NAND chain integrity
  • Features of SSD controller. Background processes.

Technological Mode. Data Recovery

  • Main concept
  • Features and functions of Technological Mode

Technological Mode. Repairing functions

  • Back to life: repairing of damaged SSD

PC-3000 SSD Active Utility set.

Examples of data recovery from real-life SSD models.
12:00 — 13:00 Lunch
13:00 — 15:00 The most frequent problems in data recovery from NAND Flash devices. Effective solutions.

Variety of NAND Flash chips types. How to find a compatible adapter.

  • Various NAND Flash chips packages
  • The most popular NAND chip types in the most common storage devices: USB, SD, CF, microSD, xD, etc.
  • ACE Lab adapters for NAND chips reading

Bit errors. Why do they happen and how to fix them?

  • Error Correction Codes (ECC)
  • Readout by map of uncorrected sectors
  • ReadRetry command
  • Voltage control. Impact on reading quality

Bad Columns (Inserts). Their influence on Flash data recovery process.

  • Software and hardware Inserts
  • Ways of Inserts elimination

XOR in present-day cases. Influence on user data.

  • Common XOR
  • Dynamic XOR
  • Methods and tools for XOR elimination.

Final Goal: building of Flash drive image in PC-3000 Flash. Different methods.

  • Translator
  • Block Number
  • Image Building Based on Data Analysis
15:00 — 15:15 Coffee Break
15:15 — 15:45 Virtual disks and encrypted partitions (FileVault, BitLocker)

  • The structure of data storage
  • Saving data from encrypted partitions
  • How to recover data if an HDD is damaged
  • Methods of working with Data Extractor
15:45 — 17:00 RAID data recovery

  • Main methods of RAID data recovery
  • How to recover data from a RAID with damaged members
  • How to detect RAID configuration
  • The problem of irrelevant data and how it can be solved
  • A brief overview of the Data Extractor RAID Edition functionality

The conference will be followed by a series of specialized training sessions:

  • "Flash Data Recovery Expert Training"
  • "RAID Data Recovery Expert Training".

How to book attendance:

To reserve your attendance, please contact ACE Lab distributor in China

Company name: Beijing JunDaCheng Technology Co., Ltd.
Contact person: Zhang Baizhen
Phone: +86 010-82888788, +86 010-82887388


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